HYSIScientific Equipment
Probe Station Microscope for Wafer Testing — industrial inspection & measuring microscope. Key configuration: long-working-distance plan apochromatic objective; range 55-75mm; coaxial vertical illumination, adjustable aperture diaphragm. Suited to Wafer Testing, Semiconductor, Failure Analysis.
| Viewing head | range 55-75mm |
|---|---|
| Objectives | long-working-distance plan apochromatic objective |
| Nosepiece | four-positionnosepiece, centrable, detachable |
| Focusing | coarse and fine knobs |
| Illumination | coaxial vertical illumination, adjustable aperture diaphragm |
| Field of view | 24mm |
| Weight | main body: 6.8kg; cold-light illuminator: 2.5kg |
HYSI-MIC-IND120 is a probe station microscope for wafer testing supplied by HYSI. Probe Station Microscope for Wafer Testing — industrial inspection & measuring microscope. Key configuration: long-working-distance plan apochromatic objective; range 55-75mm; coaxial vertical illumination, adjustable aperture diaphragm. Suited to Wafer Testing, Semiconductor, Failure Analysis.
It suits laboratories that need reliable industrial inspection, measurement, wafer testing capability — typically universities, research institutes, enterprise R&D centres and third-party testing laboratories.
Yes. Send your requirement through the contact page or the advisor panel and HYSI will reply within 24 hours with specifications, pricing and lead time.
Voltage variants are confirmed in writing before order — tell us your local standard (for example 220 V/50 Hz or 380 V/60 Hz) and HYSI will match the configuration.
Packing list, factory quality inspection report and other export documents are provided. FAT and PSI reports are available for international project acceptance requirements.
Detailed specifications and certification documents are provided by email on request.
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650 W ultrasonic processor for cell lysis, DNA/RNA extraction, emulsification and particle dispersion.
Send us your inquiry — our team will reply within 24 hours with specifications, pricing and lead time.
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